Diagnose compound scan chain and system logic defects.
| Autor: | Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Man, A. |
|---|---|
| Zdroj: | 2007 IEEE International Test Conference; 2007, p1-10, 10p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Man, A. |
|---|---|
| Zdroj: | 2007 IEEE International Test Conference; 2007, p1-10, 10p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|