Simulation and Analysis of EMC Chambers by Ray Tracing Method.

Autor:	Ming-Shing Lin, Jia-Ming Ji, Hsu, C.-I.G., Han-Chang Hsieh
Zdroj:	2007 IEEE International Symposium on Electromagnetic Compatibility; 2007, p1-4, 4p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu