Challenges for 3D IC integration: bonding quality and thermal management.

Autor: Leduca, P., de Crecy, F., Fayolle, M., Charlet, B., Enot, T., Zussy, M., Jones, B., Barbe, J.-C., Kernevez, N., Sillon, N., Maitrejean, S., Louisa, D.
Zdroj: 2007 IEEE International Interconnect Technology Conference; 2007, p210-212, 3p
Databáze: Complementary Index