Performance Analysis of III-V Materials in a Double-Gate nano-MOSFET.
Autor: | Cantley, K.D., Yang Liu, Pal, H.S., Low, T., Ahmed, S.S., Lundstrom, M.S. |
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Zdroj: | 2007 IEEE International Electron Devices Meeting; 2007, p113-116, 4p |
Databáze: | Complementary Index |
Externí odkaz: |