Performance Analysis of III-V Materials in a Double-Gate nano-MOSFET.

Autor: Cantley, K.D., Yang Liu, Pal, H.S., Low, T., Ahmed, S.S., Lundstrom, M.S.
Zdroj: 2007 IEEE International Electron Devices Meeting; 2007, p113-116, 4p
Databáze: Complementary Index