Extraction of Self-Heating Free I-V Curves Including the Substrate Current of PD SOI MOSFETs.
| Autor: | Qiang Chen, Zhi-Yuan Wu, Su, R.Y.K., Jung-Suk Goo, Thuruthiyil, C., Radwin, M., Subba, N., Suryagandh, S., Tran Ly, Wason, V., An, J.X., Icel, A.B. |
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| Zdroj: | 2007 IEEE International Conference on Microelectronic Test Structures; 2007, p272-275, 4p |
| Databáze: | Complementary Index |
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