Improved Test Structure for Thermnal Resistance Scaling Study in Power Devices.
| Autor: | Canepari, A., Bertrand, G., Giry, A., Minondo, M., Ortolland, S., Jaouen, H., Szelag, B., Mourier, J., Chante, J.-P. |
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| Zdroj: | 2007 IEEE International Conference on Microelectronic Test Structures; 2007, p222-225, 4p |
| Databáze: | Complementary Index |
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