Model-based test for analog integrated circuits.
| Autor: | Barford, L., Tufillaro, N., Jefferson, S., Khoche, A. |
|---|---|
| Zdroj: | 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007; 2007, p1-6, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Barford, L., Tufillaro, N., Jefferson, S., Khoche, A. |
|---|---|
| Zdroj: | 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007; 2007, p1-6, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|