A Strategy to Analyze Soft Reliability Issues Detected by Iddq Measurements.
| Autor: | Osterreicher, I., Nowak, C., Eckl, S., Tippelt, B., Werner, W. |
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| Zdroj: | 2007 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2007, p48-52, 5p |
| Databáze: | Complementary Index |
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