Investigation of Substrate Noise Coupling and Isolation Characteristics for a 0.35UM HV CMOS Technology.
| Autor: | Pflanzl, W.C., Seebacher, E. |
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| Zdroj: | 2007 14th International Conference on Mixed Design of Integrated Circuits & Systems; 2007, p429-432, 4p |
| Databáze: | Complementary Index |
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