Multiple Parametric Circuit Analysis Tool for Detectability Estimation.

Autor: Dimopoulos, M.G., Papakostas, D.K., Konstantinou, D.K., Spyronasios, A.D., Hatzopoulos, A.A.
Zdroj: 2007 14th IEEE International Conference on Electronics, Circuits & Systems; 2007, p1111-1114, 4p
Databáze: Complementary Index