Error Rate Improvement of 75 nm Super-RENS Signal in 405nm, 0.85 NA System.

Autor: Jaeeheol Bae, Jooh Kim, Inoh Hwang, Hyunki Kim, Jinkyung Lee, Hyunsoo Park, Insik Park, Tominaga, J.
Zdroj: 2006 Optical Data Storage Topical Meeting; 2006, p200-202, 3p
Databáze: Complementary Index