Unique ESD Failure Mechanism in a MuGFET Technology.
| Autor: | Gossner, Harald, Russ, Christian, Siegelin, Frank, Schneider, Jens, Schruefer, Klaus, Schulz, Thomas, Duvvury, Charvaka, Cleavelin, C. Rinn, Xiong, Weize |
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| Zdroj: | 2006 International Electron Devices Meeting; 2006, p1-4, 4p |
| Databáze: | Complementary Index |
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