A Screening Methodology for VMIN Drift in SRAM Arrays with Application to Sub-65nm Nodes.
| Autor: | Ball, M., Rosal, J., McKee, R., Loh, Wk., Houston, T., Garcia, R., Raval, J., Li, D., Hollingsworth, R., Gury, R., Eklund, R., Vaccani, J., Castellano, B., Piacibello, F., Ashburn, S., Tsao, A., Krishnan, A., Ondrusek, J., Anderson, T. |
|---|---|
| Zdroj: | 2006 International Electron Devices Meeting; 2006, p1-4, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|