Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs.
Autor: | Santiago Remersaro, Xijiang Lin, Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski |
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Zdroj: | 2006 IEEE International Test Conference; 2006, p1-10, 10p |
Databáze: | Complementary Index |
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