Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs.

Autor: Santiago Remersaro, Xijiang Lin, Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski
Zdroj: 2006 IEEE International Test Conference; 2006, p1-10, 10p
Databáze: Complementary Index