Reliability Characterization of Different Pore Sealing Techniques on Porous Silk Dielectric Films.
| Autor: | Michelon, J., Waeterloos, J., Bancken, P.H.L., Nguyen, V.H., Caluwaerts, R., Beyer, G., Rozeveld, S., Beach, E., Hoofman, R.J.O.M. |
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| Zdroj: | 2006 IEEE International Reliability Physics Symposium Proceedings; 2006, p496-501, 6p |
| Databáze: | Complementary Index |
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