High Threshold Voltage Matching Performance on Gate-All-Around MOSFET.

Autor: Augustin Cathignol, Antoine Cros, Samuel Harrison, Robin Cerrutti, Philippe Coronel, Arnaud Pouydebasque, Krysten Rochereau, Thomas Skotnicki, Gerard Ghibaudo
Zdroj: 2006 European Solid-State Device Research Conference; 2006, p379-382, 4p
Databáze: Complementary Index