Retention Tail Improvement for Gbit DRAMs through Trap Passivation confirmed by Activation Energy Analysis.
| Autor: | A. Weber, A. Birner, W. Krautschneider |
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| Zdroj: | 2006 European Solid-State Device Research Conference; 2006, p250-253, 4p |
| Databáze: | Complementary Index |
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