Machine Vision Recognition of Disconnection Failure of IC Wafer.
| Autor: | Guitang Wang, Dongdong Li, Liming Wu, Yaohua Deng, Runyu Liu |
|---|---|
| Zdroj: | 2006 7th International Conference on Electronic Packaging Technology; 2006, p1-4, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|