Comparison Study from Sputtering, Sol-Gel, and ALD Processes Developing Embedded Thin Film Capacitors.

Autor: Jinyong Ahn, Lee, J.Y., Joonsung Kim, JeGwang Yoo, Changsup Ryu
Zdroj: 2006 7th International Conference on Electronic Packaging Technology; 2006, p1-5, 5p
Databáze: Complementary Index