Gate sizing: finFETs vs 32nm bulk MOSFETs.
| Autor: | Swahn, B., Soha Hassoun |
|---|---|
| Zdroj: | 2006 43rd ACM/IEEE Design Automation Conference; 2006, p528-531, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Swahn, B., Soha Hassoun |
|---|---|
| Zdroj: | 2006 43rd ACM/IEEE Design Automation Conference; 2006, p528-531, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|