Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis.
| Autor: | Seike, S., Namura, K., Ohya, Y., Uzzaman, A., Arima, S., Meehl, D., Chickermane, V., Kobayashi, A., Tanaka, S., Adachi, H. |
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| Zdroj: | 2006 15th Asian Test Symposium; 2006, p415-420, 6p |
| Databáze: | Complementary Index |
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