Flash Annealing Technology for USJ: Modeling and Metrology.

Autor: Gelpey, J., McCoy, S., Camm, D., Lerch, W., Paul, S., Pichler, P., Borland, J.O., Timans, P.
Zdroj: 2006 14th IEEE International Conference on Advanced Thermal Processing of Semiconductors; 2006, p103-110, 8p
Databáze: Complementary Index