Ultra-thin gate dielectric reliability projections.
| Autor: | Moosa, M., Haggag, A., Liu, N., Kalpat, S., Kuffler, M., Menke, D., Abramowitz, P., Ramon, M.E., Tseng, H.H., Luo, T.Y., Lim, S., Grudowski, P., Jiang, J., Min, B.W., Weintraub, C., Chen, J., Wong, S., Paquette, C., Anderson, G., Tobin, P.J. |
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| Zdroj: | 2005 International Conference on Integrated Circuit Design & Technology, 2005. ICICDT 2005; 2005, p129-133, 5p |
| Databáze: | Complementary Index |
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