Observation and restoration of negative electromigration activation energy behavior due to thermo-mechanical effects.
| Autor: | Young-Joon Park, Ki-Don Lee, Hunter, W.R. |
|---|---|
| Zdroj: | 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings 43rd Annual; 2005, p18-23, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|