Characterization and Recovery of Deep Sub Micron (DSM) Technologies Behavior Under Radiation.

Autor: Stoica, A., Xiao Wang, Keymeulen, D., Zebulum, R.S., Ferguson, M.I., Xin Guo
Zdroj: 2005 IEEE Aerospace Conference; 2005, p1-9, 9p
Databáze: Complementary Index