Characterization and Recovery of Deep Sub Micron (DSM) Technologies Behavior Under Radiation.
Autor: | Stoica, A., Xiao Wang, Keymeulen, D., Zebulum, R.S., Ferguson, M.I., Xin Guo |
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Zdroj: | 2005 IEEE Aerospace Conference; 2005, p1-9, 9p |
Databáze: | Complementary Index |
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