Benchmarking diagnosis algorithms with a diverse set of IC deformations.
| Autor: | Vogels, T., Zanon, T., Desineni, R., Blanton, R.D., Maly, W., Brown, J.G., Nelson, J.E., Fei, Y., Huang, X., Gopalakrishnan, P., Mishra, M., Rovner, V., Tiwary, S. |
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| Zdroj: | 2004 International Conference on Test; 2004, p508-517, 10p |
| Databáze: | Complementary Index |
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