X-masking during logic BIST and its impact on defect coverage.
| Autor: | Yuyi Tang, Wunderlich, H.-J., Vranken, H., Hapke, F., Wittke, M., Engelke, P., Polian, I., Becker, B. |
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| Zdroj: | 2004 International Conference on Test; 2004, p442-451, 10p |
| Databáze: | Complementary Index |
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