Plasma induced substrate damage in high dose implant resist strip process.

Autor: Bor-Wen Chan, Baw-Ching Perng, Sheu, L., Yuan-Hung Chiu, Han-Jan Tao
Zdroj: 2003 8th International Symposium Plasma- & Process-Induced Damage; 2003, p73-76, 4p
Databáze: Complementary Index