A Process for optimizing probe and final test through parameter matching.
| Autor: | Shumaker, J., Lauderdale, M., Shults, K. |
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| Zdroj: | 2003 5th International Conference on ASIC. Proceedings (IEEE Cat. No.03TH8690); 2003, p431-434, 4p |
| Databáze: | Complementary Index |
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