Long-term reliability of Si-Si0.7Ge0.3-Si HBTs from accelerated lifetime testing.
| Autor: | Zhengqiang Ma, Jae-Sung Rieh, Bhattacharya, P., Alterovitz, S.A., Ponchak, G.E., Croke, E.T. |
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| Zdroj: | 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (IEEE Cat. No.01EX496); 2001, p122-130, 9p |
| Databáze: | Complementary Index |
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