Investigation of temperature effects on electron transport in SiC using unique full band Monte Carlo simulation.

Autor: Pennington, G., Goldsman, N., Scozzie, S., McGarrity, J.M., McLean, B.
Zdroj: 2001 International Semiconductor Device Research Symposium. Symposium Proceedings (Cat. No.01EX497); 2001, p531-534, 4p
Databáze: Complementary Index