Total dose testing of 10-bit low voltage differential signal (LVDS) serializer and deserializer.
| Autor: | Hamilton, B.J., Turflinger, T.L. |
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| Zdroj: | 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in Conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.01TH8588); 2001, p177-181, 5p |
| Databáze: | Complementary Index |
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