Managing, measuring and improving equipment capacity and overall equipment efficiency (OEE) using iPLUS.
| Autor: | Killeen, D., Gaboury, P., Paccard, D. |
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| Zdroj: | 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203); 2001, p25-28, 4p |
| Databáze: | Complementary Index |
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