Highly accelerated life testing for non-hermetic laser modules.
| Autor: | Theis, C.D., Siconolfi, D.J., Comizzoli, R.B., Kiely, P.A., Wu, P., Chakrabarti, U.K., Osenbach, J.W. |
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| Zdroj: | 2000 Proceedings 50th Electronic Components & Technology Conference (Cat. No.00CH37070); 2000, p955-961, 7p |
| Databáze: | Complementary Index |
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