Advanced doping and millisecond annealing for ultra-shallow junctions for 65 nm and beyond.

Autor: McCoy, S.P., Arevalo, E.A., Gelpey, J.C., Downey, D.F.
Zdroj: 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors, 2004. RTP 2004; 2004, p99-108, 10p
Databáze: Complementary Index