On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores.
| Autor: | Bemardi, P., Grosso, M., Sanchez, E., Reorda, M.S. |
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| Zdroj: | 12th IEEE European Test Symposium (ETS'07); 2007, p179-184, 6p |
| Databáze: | Complementary Index |
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