Vertical charge imbalance effect on 600 V-class trench-filling superjunction power MOSFETs.
Autor: | Tamaki, T., Nakazawa, Y., Kanai, H., Abiko, Y., Ikegami, Y., Ishikawa, M., Wakimoto, E., Yasuda, T., Eguchi, S. |
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Zdroj: | 2011 IEEE 23rd International Symposium on Power Semiconductor Devices & ICs (ISPSD); 2011, p308-311, 4p |
Databáze: | Complementary Index |
Externí odkaz: |