Measurement of shear stress between single-wall carbon nanotubes and substrates using NEMS devices.
| Autor: | Pan, H.Y., Wu, Y.C., Ryan, P.J., Adams, G.G., McGruer, N.E. |
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| Zdroj: | 2011 16th International Solid-State Sensors, Actuators & Microsystems Conference (TRANSDUCERS); 2011, p629-632, 4p |
| Databáze: | Complementary Index |
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