Realistic simulation on reverse characteristics of SiC/GaN p-n junctions for high power semiconductor devices.

Autor: Guannan Wei, Liang, Y.C., Samudra, G.S.
Zdroj: 2011 IEEE 8th International Conference on Power Electronics & ECCE Asia (ICPE & ECCE); 2011, p1464-1468, 5p
Databáze: Complementary Index