Statistical analysis of binarized SIFT descriptors.
| Autor: | Diephuis, M., Voloshynovskiy, S., Koval, O., Beekhof, F. |
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| Zdroj: | 2011 7th International Symposium on Image & Signal Processing & Analysis (ISPA); 2011, p460-465, 6p |
| Databáze: | Complementary Index |
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