Reduced complexity test generation algorithms for transition fault diagnosis.
| Autor: | Yu Zhang, Agrawal, V.D. |
|---|---|
| Zdroj: | 2011 IEEE 29th International Conference on Computer Design (ICCD); 2011, p96-101, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Yu Zhang, Agrawal, V.D. |
|---|---|
| Zdroj: | 2011 IEEE 29th International Conference on Computer Design (ICCD); 2011, p96-101, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|