Boosting power to detect genetic associations in imaging using multi-locus, genome-wide scans and ridge regression.

Autor: Kohannim, O., Hibar, D.P., Stein, J.L., Jahanshad, N., Jack, C.R., Weiner, M.W., Toga, A.W., Thompson, P.M.
Zdroj: 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro; 2011, p1855-1859, 5p
Databáze: Complementary Index