Research on the failure property of VDMOS device by thermal cycles.
| Autor: | Yin Jinghua, Hua Qing, He Yanqiang, Cao Yijiang, Chen Minghua, Liu Ting, Liu Xiaowei |
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| Zdroj: | 2011 12th International Conference on Thermal, Mechanical & Multi-Physics Simulation & Experiments in Microelectronics & Microsystems (EuroSimE); 2011, p1/4-4/4-4/4, 1p |
| Databáze: | Complementary Index |
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