A Summary of Single Event Upset Testing of CD4000 Series Devices.
| Autor: | Lombardi, R.E., Bogorad, A.L., Likar, J.J., Rubin, A.S., Camacho, C.F. |
|---|---|
| Zdroj: | 2011 IEEE Radiation Effects Data Workshop (REDW); 2011, p1-4, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|