A Summary of Single Event Upset Testing of CD4000 Series Devices.
Autor: | Lombardi, R.E., Bogorad, A.L., Likar, J.J., Rubin, A.S., Camacho, C.F. |
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Zdroj: | 2011 IEEE Radiation Effects Data Workshop (REDW); 2011, p1-4, 4p |
Databáze: | Complementary Index |
Externí odkaz: |