Automated substrate resistance extraction in nanoscale VLSI by exploiting a geometry-based analytical model.
Autor: | Bontzios, Y.I., Dimopoulos, M.G., Hatzopoulos, A.A. |
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Zdroj: | 2011 Proceedings of the 18th International Conference Mixed Design of Integrated Circuits & Systems (MIXDES); 2011, p432-437, 6p |
Databáze: | Complementary Index |
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