Ruggedness and reliability of GaN HEMT.
| Autor: | Yamaki, F., Inoue, K., Nishi, M., Haematsu, H., Ui, N., Ebihara, K., Nitta, A., Sano, S. |
|---|---|
| Zdroj: | Microwave Integrated Circuits Conference (EuMIC), 2011 European; 2011, p328-331, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|