Contact resistance measurement structures for high frequencies.
| Autor: | Roy, D., Pijper, R.M.T., Tiemeijer, L.F., Wolters, R.A.M. |
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| Zdroj: | 2011 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2011, p49-54, 6p |
| Databáze: | Complementary Index |
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