Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design.

Autor: Cheng-Cheng Yen, Wan-Yen Lin, Ming-Dou Ker, Ching-Ling Tsai, Shih-Fan Chen, Tung-Yang Chen
Zdroj: 2011 IEEE International Conference on IC Design & Technology (ICICDT); 2011, p1-4, 4p
Databáze: Complementary Index