Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis.
| Autor: | Alves, N., Shi, Y., Imbriglia, N., Dworak, J., Nepal, K., Bahar, R.I. |
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| Zdroj: | European Test Symposium (ETS), 2011 16th IEEE; 2011, p211-211, 1p |
| Databáze: | Complementary Index |
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