Structural In-Field Diagnosis for Random Logic Circuits.
| Autor: | Cook, A., Elm, M., Wunderlich, H., Abelein, U. |
|---|---|
| Zdroj: | European Test Symposium (ETS), 2011 16th IEEE; 2011, p111-116, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Cook, A., Elm, M., Wunderlich, H., Abelein, U. |
|---|---|
| Zdroj: | European Test Symposium (ETS), 2011 16th IEEE; 2011, p111-116, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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